Y - The plot point of the IP reading (m)
X - Line (m)
Topo - elevation (m)
T1Y - IP current location in local coordinates (m)
T2Y - IP infinite location in local coordinates (m)
R1Y - Lead potiential location in local coordinates (m)
R2Y - Far potiential location in local coordinates (m)
VP - Primary Voltage in (mV)
I - Current (mA)
IP_Avg - Raw IP reading (mV/V)
IP[0] - IP[20] - Raw IP gates reading
Q - Standard deviation of IP readings 
QC - Quality Control
Chg - Chargeability (mV/V)
N - Potiential dipole number
SP - Spontaineous polerization 
Stack - Number of stacks taking during the reading
Stn - The plot point of the IP reading (m)
RSCheck - the contact resistance (ohm)
Topo - The elevation
T1_NAD83_UTME_8N - IP current location in UTM coordinates (m)
T1_NAD83_UTMN_8N
T2_NAD83_UTME_8N - IP infinite location in UTM coordinates (m)
T2_NAD83_UTMN_8N
R1_NAD83_UTME_8N - Lead potiential location in UTM coordinates (m)
R1_NAD83_UTMN_8N
R2_NAD83_UTME_8N - Far potiential location in UTM coordinates (m)
R2_NAD83_UTMN_8N
Stn_NAD83_UTME_8N - The Plot point in UTM Coordinates (m)
Stn_NAD83_UTMN_8N
CalcAppRes - Calculated apparent resistivity (ohm*m)
FINAL_APP_RES - The Final calculated apparent resistivity (ohm*m)
FINAL_IP - The final chargeability (mV/V)
FINAL_IP_ERR - the final standard deviation of the IP reading
MF - Metal Factor 



